{"identifier":"nobleid:/w1/20260521/1028BF73","arkIdentifier":"ark:/48914/w1/20260521/1028BF73","version":1,"workTitle":"A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids","workType":"Journal Article","authors":"Yoosuf N. Picard","description":null,"workUrl":null,"existingDoi":"10.1017/s1431927618003641","createdAt":"2026-05-21T18:14:11.001383Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/1028BF73.v1"}