{"identifier":"nobleid:/w1/20260521/151EEE82","arkIdentifier":"ark:/48914/w1/20260521/151EEE82","version":1,"workTitle":"Entwicklung einer Methodik zur Bestimmung der Schaltverluste von diskreten 400V-GaN-Halbbrücken","workType":"Journal Article","authors":"Bauer, Nikolas","description":null,"workUrl":null,"existingDoi":"10.18419/opus-13150","createdAt":"2026-05-21T16:35:46.486266Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/151EEE82.v1"}