{"identifier":"nobleid:/w1/20260521/175DB94B","arkIdentifier":"ark:/48914/w1/20260521/175DB94B","version":1,"workTitle":"Pyrometric Measurements of Si, Ge, and GaAs Wafers Between 100° and 700°C","workType":"Journal Article","authors":"F. Jona, Hartmut Wendt","description":null,"workUrl":null,"existingDoi":"10.1063/1.1708925","createdAt":"2026-05-21T20:15:05.294888Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/175DB94B.v1"}