{"identifier":"nobleid:/w1/20260521/1ADEF853","arkIdentifier":"ark:/48914/w1/20260521/1ADEF853","version":1,"workTitle":"Speckle technique for dynamic drop profile measurement on rough surfaces","workType":"Journal Article","authors":"Jason Schmucker, Joshua Osterhout, Edward White","description":null,"workUrl":null,"existingDoi":"10.1007/s00348-011-1199-7","createdAt":"2026-05-21T21:31:03.044650Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/1ADEF853.v1"}