{"identifier":"nobleid:/w1/20260521/290BA7F0","arkIdentifier":"ark:/48914/w1/20260521/290BA7F0","version":1,"workTitle":"Characterization of Dynamic Behaviour of Metal-Semiconductor-Metal Photodetectors by Correlation Technique","workType":"Journal Article","authors":"Markus Sickmöller, Peter Urbach Peter Urbach, Wolfgang Kowalsky","description":null,"workUrl":null,"existingDoi":"10.1143/jjap.33.844","createdAt":"2026-05-21T12:31:30.333616Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/290BA7F0.v1"}