{"identifier":"nobleid:/w1/20260521/2CD673F2","arkIdentifier":"ark:/48914/w1/20260521/2CD673F2","version":1,"workTitle":"Hot-carrier injection suppression due to the nitride-oxide LDD spacer structure","workType":"Journal Article","authors":"Tomohisa Mizuno, Seiji Sawada, Y. Saitoh, Tomoharu Tanaka","description":null,"workUrl":null,"existingDoi":"10.1109/16.75170","createdAt":"2026-05-21T16:36:13.703793Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/2CD673F2.v1"}