{"identifier":"nobleid:/w1/20260521/2DB92FE2","arkIdentifier":"ark:/48914/w1/20260521/2DB92FE2","version":1,"workTitle":"CW Technique for Measurement of Linewidth Enhancement Factor: Application to 735-nm Tensile-Strained GaAsP Quantum-Well Lasers","workType":"Journal Article","authors":"Daniel Rodríguez, L. Borruel, I. Esquivias, H. Wenzel, Bernd Sumpf, G. Erbert","description":null,"workUrl":null,"existingDoi":"10.1109/lpt.2004.826761","createdAt":"2026-05-21T15:12:16.909570Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/2DB92FE2.v1"}