{"identifier":"nobleid:/w1/20260521/8CFB64DF","arkIdentifier":"ark:/48914/w1/20260521/8CFB64DF","version":1,"workTitle":"An Optimization Algorithm for Computing the Minimal Test Set of Circuits","workType":"Journal Article","authors":"Changhua Lu, Xiaokang Deng, Chun Liu, Yong Wang","description":null,"workUrl":null,"existingDoi":"10.1109/iita.workshops.2008.186","createdAt":"2026-05-21T21:54:19.419500Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/8CFB64DF.v1"}