{"identifier":"nobleid:/w1/20260521/AD67922B","arkIdentifier":"ark:/48914/w1/20260521/AD67922B","version":1,"workTitle":"The Size Effect of Ion Charge Tracks on Single Event Multiple-Bit Upset","workType":"Journal Article","authors":"R Märtin, Nasr M. Ghoniem, Yu Song, J.S. Cable","description":null,"workUrl":null,"existingDoi":"10.1109/tns.1987.4337470","createdAt":"2026-05-21T12:03:59.300315Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/AD67922B.v1"}