{"identifier":"nobleid:/w1/20260521/B0CFBAFF","arkIdentifier":"ark:/48914/w1/20260521/B0CFBAFF","version":1,"workTitle":"Electronic and oxide ion conductivity in Pr2Ni0.71Cu0.24Ga0.05O4/Ce0.8Sm0.2O2 laminated film","workType":"Journal Article","authors":"Junji Hyodo, Shintaro Ida, John A. Kilner, Tatsumi Ishihara","description":null,"workUrl":null,"existingDoi":"10.1016/j.ssi.2012.10.018","createdAt":"2026-05-21T14:10:23.639596Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/B0CFBAFF.v1"}