{"identifier":"nobleid:/w1/20260521/BC9BC577","arkIdentifier":"ark:/48914/w1/20260521/BC9BC577","version":1,"workTitle":"Electronic structure of silicon nitride studied by both soft x-ray spectroscopy and photoelectron spectroscopy","workType":"Journal Article","authors":"C. Sénémaud, M. Driss Khodja, A. Gheorghiu, Sylvie Harel, G. Dufour, H. Roulet","description":null,"workUrl":null,"existingDoi":"10.1063/1.354286","createdAt":"2026-05-21T19:30:44.216241Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/BC9BC577.v1"}