{"identifier":"nobleid:/w1/20260521/C9727365","arkIdentifier":"ark:/48914/w1/20260521/C9727365","version":1,"workTitle":"Single event coupling delay estimation in nanometer technologies","workType":"Journal Article","authors":"Selahattin Sayıl, Yao Yao","description":null,"workUrl":null,"existingDoi":"10.1007/s10470-015-0670-4","createdAt":"2026-05-21T19:56:08.614612Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/C9727365.v1"}