{"identifier":"nobleid:/w1/20260521/CF5F034D","arkIdentifier":"ark:/48914/w1/20260521/CF5F034D","version":1,"workTitle":"Simulation of GaAs submicron FET with hot-electron injection structure","workType":"Journal Article","authors":"K. Tomizawa, Yuji Awano, N. Hashizume, M. Kawashima","description":null,"workUrl":null,"existingDoi":"10.1049/el:19830475","createdAt":"2026-05-21T17:32:46.951783Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/CF5F034D.v1"}