{"identifier":"nobleid:/w1/20260521/F59CFACF","arkIdentifier":"ark:/48914/w1/20260521/F59CFACF","version":1,"workTitle":"Non-Invasive Dual-Probe Time Domain Measurements of Incident and Reflected Waves on High-speed Digital Chip Interconnects","workType":"Journal Article","authors":"Alain Barel, Yves Rolain, Ann Cumps","description":null,"workUrl":null,"existingDoi":"10.1109/arftg.1997.327229","createdAt":"2026-05-21T14:39:44.513805Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260521/F59CFACF.v1"}