{"identifier":"nobleid:/w1/20260523/4FD767CD","arkIdentifier":"ark:/48914/w1/20260523/4FD767CD","version":1,"workTitle":"Switching circuit design and simulation analysis for interturn voltage tester","workType":"Journal Article","authors":"Kai Zou, Aiming Zhao","description":null,"workUrl":null,"existingDoi":"10.1117/12.3069106","createdAt":"2026-05-23T16:28:44.409675Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260523/4FD767CD.v1"}