{"identifier":"nobleid:/w1/20260525/90A02027","arkIdentifier":"ark:/48914/w1/20260525/90A02027","version":1,"workTitle":"Reliable Measurement of Double Probe in Low-Density Plasmas","workType":"Journal Article","authors":"Xinyao Xie, Yanhui Li, Qinghe Zhang, Yu‐Zhang Ma, Zan‐Yang Xing, Jin Wang, Shigang Zheng, Xin Guo","description":null,"workUrl":null,"existingDoi":"10.2139/ssrn.5867585","createdAt":"2026-05-25T21:07:32.397740Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260525/90A02027.v1"}