{"identifier":"nobleid:/w1/20260525/93FC10BE","arkIdentifier":"ark:/48914/w1/20260525/93FC10BE","version":1,"workTitle":"Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers","workType":"Journal Article","authors":"Olivier Palais, A. Arcari","description":null,"workUrl":null,"createdAt":"2026-05-25T06:42:55.923315Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260525/93FC10BE.v1"}