{"identifier":"nobleid:/w1/20260526/BC4E5ABC","arkIdentifier":"ark:/48914/w1/20260526/BC4E5ABC","version":1,"workTitle":"Solution-processed memristors: performance and reliability","workType":"Journal Article","authors":"Sebastian Pazos, Xiangming Xu, Tianchao Guo, Kaichen Zhu, Husam N. Alshareef, Mario Lanza","description":null,"workUrl":null,"existingDoi":"10.1038/s41578-024-00661-6","createdAt":"2026-05-26T03:56:24.851334Z","canonicalUrl":"https://nobleid.org/ark:/48914/w1/20260526/BC4E5ABC.v1"}