基于YOLOv8-PCB的印制电路板缺陷检测 | NobleID

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基于YOLOv8-PCB的印制电路板缺陷检测

Identifier:nobleid.org/w1/20260515/CF0CEAF4

Type:Journal Article

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王艳 Wang Yan

罗健 Luo Jian

彭宏 Peng Hong

陈思毅 Chen Siyi

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