Crack origin and detection in thin cristallyne solar cells in a production line

Eneko Cereceda; José Rubén Gutiérrez; J.C. Jimeno; Josu Barredo Egusquiza; Alberto Fraile; Enrique Alarcón Álvarez; S. Ostapenko; Ana Luisa Martínez; Vázquez

doi:10.1016/j.jenvman.2013.05.026

Crack origin and detection in thin cristallyne solar cells in a production line

Identifier:nobleid.org/w1/20260515/087C7DB4

Type:Journal Article

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Eneko Cereceda

José Rubén Gutiérrez

J.C. Jimeno

Josu Barredo Egusquiza

Alberto Fraile

Enrique Alarcón Álvarez

S. Ostapenko

Ana Luisa Martínez

Vázquez

Claim authorship of this work

Crack origin and detection in thin cristallyne solar cells in a production line

Identifier:nobleid.org/w1/20260515/087C7DB4

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

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[![NobleID](https://www.nobleid.org/api/badge/087C7DB4.svg?ark=w1%2F20260515%2F087C7DB4)](https://nobleid.org/work/w1/20260515/087C7DB4)

ARK Inflections

Metadata Policy

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Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

Eneko Cereceda

José Rubén Gutiérrez

J.C. Jimeno

Josu Barredo Egusquiza

Alberto Fraile

Enrique Alarcón Álvarez

S. Ostapenko

Ana Luisa Martínez

Vázquez

Claim authorship of this work