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A BUILT-IN TEST CIRCUIT FOR DETECTING OPEN INTERCONNECTS IN 3D ICS

Identifier:nobleid.org/w1/20260515/314219FC

Type:Journal Article

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Widianto Widianto

Hiroyuki Yotsuyanagi

Masaki Hashizume

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A BUILT-IN TEST CIRCUIT FOR DETECTING OPEN INTERCONNECTS IN 3D ICS | NobleID