Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system

Albert C. To; Wing Kam Liu; Gregory B. Olson; Ted Belytschko; Wei Chen; Mark S. Shephard; Yip-Wah Chung; Roger Ghanem; Peter W. Voorhees; David N. Seidman

doi:10.1007/s00466-008-0267-1

Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system

Identifier:nobleid.org/w1/20260515/48F313B7

Type:Journal Article

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Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system

Identifier:nobleid.org/w1/20260515/48F313B7

Type:Journal Article

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