On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

Gavin Muncaster; A. T. Davies; Gopinathan Sankar; C. Richard A. Catlow; John Meurig Thomas; Sally L. Colston; P. Barnes; Richard I. Walton; Dermot O’Hare

doi:10.1039/b004171h

On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

Identifier:nobleid.org/w1/20260515/7CDD63D2

Type:Journal Article

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On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures

Identifier:nobleid.org/w1/20260515/7CDD63D2

Type:Journal Article

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