Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer.

Tsuguhisa Sekioka; Kouichi Hayashi; Eiichiro Matsubara; Yukio Takahashi; Tetsutaro Hayashi; Mititaka Terasawa; Tohru Mitamura; Akihiro Iwase; Osamu Michikami

doi:10.1107/S0909049505006497

Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer.

Identifier:nobleid.org/w1/20260515/ADA28F7B

Type:Journal Article

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Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer.

Identifier:nobleid.org/w1/20260515/ADA28F7B

Type:Journal Article

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