基于模式纯度测量的少模光纤熔接特性及参数优化研究 | NobleID

Main

Mint Work Search Explore Works Knowledge Graph Citation Graph Bibliometrics Receipts

v1

基于模式纯度测量的少模光纤熔接特性及参数优化研究

Identifier:nobleid.org/w1/20260515/AF861FF2

Type:Journal Article

0 views

Support unavailableClaim Your Authorship

View Original Paper Source

Embeddable Badge

[![NobleID](https://www.nobleid.org/api/badge/AF861FF2.svg?ark=w1%2F20260515%2FAF861FF2)](https://nobleid.org/work/w1/20260515/AF861FF2)

ARK Inflections

Metadata Policy

Metadata Formats

Bibliometric Analysis

Impact metrics, research fronts, co-authorship networks →

Authors & Claims

Paper Authors

李泽丰 Li Zefeng

史泽昆 Shi Zekun

郭慧毅 Guo Huiyi

谷乐天 Gu Letian

陈佳庆 Chen Jiaqing

王志 Wang Zhi

刘艳格 Liu Yange

Claim authorship of this work

info@nobleid.org

About FAQ Terms Policy Persistence & Resolver Service Policy